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High-Temperature Manual Chip Test Handler

Manual handler capable of high-temperature measurement inspection for chip devices, temperature up to 250℃.

Manual handler capable of measuring chip devices at high temperatures up to 250℃ Place the chip on the table and start Automatically measures and ejects the device Overheating of devices up to 250℃ is possible Contacts are made using probe pins Compatible if supplied contacts are available

  • Other inspection equipment and devices
  • Testing Equipment and Devices
  • probe
  • Chip Test Handler

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